EDX-8100 - Specs
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7000/8000/8100
Measurement principle |
X-ray fluorescence spectrometry |
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Measurement method |
Energy dispersion |
Target samples |
Solids, liquids, powders |
Measuring range |
11Na to 92U (EDX-7000) 6C to 92U (EDX-8000/8100) |
Sample size |
W 300 x D 275 x approx.H 100 mm (excluding radiuses) |
Maximum sample mass |
5kg (200g per sample when using turret, Gross mass 2.4kg) |
X-ray generator
X-ray tube |
Rh target |
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Voltage |
4 kV to 50 kV |
Current |
1 μA to 1000 μA |
Cooling method |
Air-cooled (with fan) |
Irradiated area |
Automatic switching in four stages: 1, 3, 5, and 10 mm diameter |
Primary filters |
Five types (six, including the open position), automatic replacement |
*1 Option for EDX-7000/8000/8100
Sample chamber
Measurement atmosphere |
Air, vacuum*1, helium (He)*2 |
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Sample replacement* |
12-sample turret |
Sample observations |
Semiconductor camera |
*1 Option for EDX-7000/8000/8100
*2 Option for EDX-7000
Data processor
Memory |
2 GB min. (32-bit), 4 GB min. (64-bit) |
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HDD |
250 GB min. |
OS |
WindowsTM 10 (32-bit/64-bit)* |
Software |
Simple analysis software (PCEDX-Navi) |
* Microsoft Office is not included.
Software
Qualitative analysis |
Measurement/analysis software |
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Quantitative analysis |
Calibration curve method, correction for coexistent elements, FP method,film FP method, background FP method |
Matching software |
Intensity/content |
Utilities |
Automatic calibration functions (energy calibration, FWHM calibration) |
Others |
Instrument status monitoring function, |
Installation
Temperature |
10 °C to 30 °C (temperature fluctuation rate 2 °C/hour max., |
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Relative humidity |
40 % to 70 % (no condensation) |
Power supply |
100-240 V AC ±10 %, 2 A earthed socket |
Dimensions |
W 460 x D 590 x H 360 mm |
Weight |
Approx. 45 kg |
Options |
Vacuum measurement unit, helium purge unit, turret unit, screening analysis kits |